In Optics express
To solve limited efficiency and reliability issues caused by current manual quality control processes in optical lens (OL) production environments, we propose an automatic micro vision-based inspection system named MVIS used to capture the surface defect images and make the OL dataset and predictive inference. Because of low resolution and recognition, OL defects are weak, due to their ambiguous morphology and micro size, making a poor detection effect for the existing method. A deep-learning algorithm for a weak micro-defect detector named ISE-YOLO is proposed, making the best for deep layers, utilizing the ISE attention mechanism module in the neck, and introducing a novel class loss function to extract richer semantics from convolution layers and learning more information. Experimental results on the OL dataset show that ISE-YOLO demonstrates a better performance, with the mean average precision, recall, and F1 score increasing by 3.62%, 6.12% and 3.07% respectively, compared to the YOLOv5. In addition, compared with YOLOv7, which is the latest version of YOLO serials, the mean average precision of ISE-YOLO is improved by 2.58%, the weight size is decreased by more than 30% and the speed is increased by 16%.
Yang Wennuo, Chen Meiyun, Wu Heng, Lin Zhengyang, Kong Deqing, Xie Shengli, Takamasu Kiyoshi
2023-Feb-13
