In Neural networks : the official journal of the International Neural Network Society
Existing deep learning based face anti-spoofing (FAS) or deepfake detection approaches usually rely on large-scale datasets and powerful networks with significant amount of parameters to achieve satisfactory performance. However, these make them resource-heavy and unsuitable for handheld devices. Moreover, they are limited by the types of spoof in the dataset they train on and require considerable training time. To produce a robust FAS model, they need large datasets covering the widest variety of predefined presentation attacks possible. Testing on new or unseen attacks or environments generally results in poor performance. Ideally, the FAS model should learn discriminative features that can generalize well even on unseen spoof types. In this paper, we propose a fast learning approach called Domain Effective Fast Adaptive nEt-worK (DEFAEK), a face anti-spoofing approach based on the optimization-based meta-learning paradigm that effectively and quickly adapts to new tasks. DEFAEK treats differences in an environment as domains and simulates multiple domain shifts during training. To further improve the effectiveness and efficiency of meta-learning, we adopt the metric learning in the inner loop update with careful sample selection. With extensive experiments on the challenging CelebA-Spoof and FaceForensics++ datasets, the evaluation results show that DEFAEK can learn cues independent of the environment with good generalization capability. In addition, the resulting model is lightweight following the design principle of modern lightweight network architecture and still generalizes well on unseen classes. In addition, we also demonstrate our model's capabilities by comparing the numbers of parameters, FLOPS, and model performance with other state-of-the-art methods.
Lin Jiun-Da, Han Yue-Hua, Huang Po-Han, Tan Julianne, Chen Jun-Cheng, Tanveer M, Hua Kai-Lung
2023-Jan-25
DeepFake, Face anti-spoofing, Fast learning, Meta-learning, Metric loss
