Deep learning algorithms are one of most rapid developing fields into the modern computation technologies. One of the bottlenecks into the implementation of such advaced algorithms is their requirement for a large amount of manually-labelled data for training. For the general-purpose tasks, such as general purpose image classification/detection the huge images datasets are already labelled and collected. For more subject specific tasks (such as electron microscopy images treatment), no labelled data available. Here I demonstrate that a deep learning network can be successfully trained for nanoparticles detection using semi-synthetic data. The real SEM images were used as a textures for rendered nanoparticles at the surface. Training of RetinaNet architecture using transfer learning can be helpful for the large-scale particle distribution analysis. Beyond such applications, the presented approach might be applicable to other tasks, such as image segmentation.
Kharin A Yu
Image processing, convolutional neural networks, deep learning, detection, nanoparticles, scanning electron microscopy, synthetic data