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DeepRes: a new deep-learning- and aspect-based local resolution method for electron-microscopy maps.
In IUCrJ ; h5-index 0.0
RamÃrez-Aportela Erney, Mota Javier, Conesa Pablo, Carazo Jose Maria, Sorzano Carlos Oscar S
2019-Nov-01
3D reconstruction and image processing, DeepRes, cryo-electron microscopy, electron microscopy, local resolution, single-particle analysis, single-particle cryoEM, structure determination
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